arch/sparc/include/asm/estate.h

Source file repositories/reference/linux-study-clean/arch/sparc/include/asm/estate.h

File Facts

System
Linux kernel
Corpus path
arch/sparc/include/asm/estate.h
Extension
.h
Size
2287 bytes
Lines
51
Domain
Architecture Layer
Bucket
arch/sparc
Inferred role
Architecture Layer: implementation source
Status
source implementation candidate

Why This File Exists

CPU and platform-specific kernel glue: boot entry, traps, syscall entry, interrupts, page tables, context switch, and low-level barriers.

Dependency Surface

Detected Declarations

Annotated Snippet

#ifndef _SPARC64_ESTATE_H
#define _SPARC64_ESTATE_H

/* UltraSPARC-III E-cache Error Enable */
#define ESTATE_ERROR_FMT	0x0000000000040000 /* Force MTAG ECC		*/
#define ESTATE_ERROR_FMESS	0x000000000003c000 /* Forced MTAG ECC val	*/
#define ESTATE_ERROR_FMD	0x0000000000002000 /* Force DATA ECC		*/
#define ESTATE_ERROR_FDECC	0x0000000000001ff0 /* Forced DATA ECC val	*/
#define ESTATE_ERROR_UCEEN	0x0000000000000008 /* See below			*/
#define ESTATE_ERROR_NCEEN	0x0000000000000002 /* See below			*/
#define ESTATE_ERROR_CEEN	0x0000000000000001 /* See below			*/

/* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache
 * errors 2) uncorrectable E-cache errors.  Such events only occur on reads
 * of the E-cache by the local processor for: 1) data loads 2) instruction
 * fetches 3) atomic operations.  Such events _cannot_ occur for: 1) merge
 * 2) writeback 2) copyout.  The AFSR bits associated with these traps are
 * UCC and UCU.
 */

/* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps
 * for uncorrectable ECC errors and system errors.
 *
 * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT,
 * or system bus BusERR:
 * 1) As the result of an instruction fetch, will generate instruction_access_error
 * 2) As the result of a load etc. will generate data_access_error.
 * 3) As the result of store merge completion, writeback, or copyout will
 *    generate a disrupting ECC_error trap.
 * 4) As the result of such errors on instruction vector fetch can generate any
 *    of the 3 trap types.
 *
 * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE,
 * BERR, and TO.
 */

/* CEEN enables the ECC_error trap for hardware corrected ECC errors.  System bus
 * reads resulting in a hardware corrected data or MTAG ECC error will generate an
 * ECC_error disrupting trap with this bit enabled.
 *
 * This same trap will also be generated when a hardware corrected ECC error results
 * during store merge, writeback, and copyout operations.
 */

/* In general, if the trap enable bits above are disabled the AFSR bits will still
 * log the events even though the trap will not be generated by the processor.
 */

#endif /* _SPARC64_ESTATE_H */

Annotation

Implementation Notes